Chipping potatoes are bred for their ability to produce light-colored, defect-free chips. Chips with stem-end chip defect (SECD) have dark blemishes and are undesirable to consumers and chip processors. The heritability of SECD is not known and genetic loci linked to defect formation have not been identified. Chip processing varieties ‘Wauseon’ and ‘Lenape’ were crossed and tubers from parents and 191 progeny were evaluated over four years for chip color descriptors L*, a*, and b* and SECD score in January, March, and May. Broad sense heritability for SECD was 0.64 or greater at each sampling time. Genotype data were used to construct a 1282 cM linkage map. Nine quantitative trait loci (QTL) for SECD were detected, and seven overlapped QTL for chip color traits. The QTL identified are starting points for developing molecular markers that are used to select genotypes that produce light-colored chips and have resistance to SECD formation.

中文翻译：

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鉴定“ Lenape”衍生的全同胞群体茎端芯片缺陷和薯片颜色特征的数量性状位点

薯片因其能够生产浅色，无缺陷的薯片而繁殖。具有茎端芯片缺陷（SECD）的芯片具有深色斑点，是消费者和芯片处理器所不希望的。SECD的遗传力未知，与缺陷形成相关的遗传基因座也尚未确定。杂交了芯片加工品种“ Wauseon”和“ Lenape”，并在四年中评估了来自父母和191个后代的块茎的芯片颜色描述符L *，a *和b *以及SECD分数，分别在1月，3月和5月进行。每个采样时间SECD的广义遗传力为0.64或更高。基因型数据用于构建1282 cM连锁图。检测到SECD的9个定量性状基因座（QTL），以及芯片色性状的7个重叠QTL。