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Assessing radiation dose limits for X-ray fluorescence microscopy analysis of plant specimens
Annals of Botany ( IF 3.6 ) Pub Date : 2019-11-28 , DOI: 10.1093/aob/mcz195
Michael W M Jones 1 , Peter M Kopittke 2 , Lachlan Casey 3 , Juliane Reinhardt 4 , F Pax C Blamey 2 , Antony van der Ent 5
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BACKGROUND AND AIMS X-ray fluorescence microscopy (XFM) is a powerful technique to elucidate the distribution of elements within plants. However, accumulated radiation exposure during analysis can lead to structural damage and experimental artefacts including elemental redistribution. To date, acceptable dose-limits have not been systematically established for hydrated plant specimens. METHODS Here we systematically explore acceptable dose-rate limits for investigating fresh sunflower (Helianthus annuus) leaf and root samples and investigate the time-dose damage in leaves attached to live plants. KEY RESULTS We find that dose-limits in fresh roots and leaves are comparatively low (4.1 kGy), based on localised disintegration of structures and element-specific redistribution. In contrast, frozen-hydrated samples did not incur any apparent damage even at doses as high as 587 kGy. Furthermore, we find that for living plants subjected to XFM measurement in vivo and grown for a further 9 d before being reimaged with XFM, the leaves display elemental redistribution at doses as low as 0.9 kGy and they continue to develop bleaching and necrosis in the days after exposure. CONCLUSIONS The suggested radiation dose limits for studies using XFM to examine plants are important for the increasing number of plant scientists undertaking multidimensional measurements such as tomography and repeated imaging using XFM.

中文翻译:

评估植物标本 X 射线荧光显微镜分析的辐射剂量限制

背景和目的 X 射线荧光显微镜 (XFM) 是阐明植物内元素分布的强大技术。然而,分析过程中累积的辐射暴露会导致结构损坏和实验伪影,包括元素重新分布。迄今为止,尚未系统地确定水合植物标本的可接受剂量限值。方法 在这里,我们系统地探索了研究新鲜向日葵 (Helianthus annuus) 叶和根样本的可接受剂量率限制,并研究了附着在活植物上的叶的时间剂量损伤。主要结果我们发现新鲜根和叶的剂量限制相对较低 (4.1 kGy),基于结构的局部分解和元素特异性重新分布。相比之下,即使在高达 587 kGy 的剂量下,冷冻水合样品也没有造成任何明显的损害。此外,我们发现对于活体植物进行 XFM 测量并在用 XFM 重新成像之前再生长 9 天,叶子在低至 0.9 kGy 的剂量下显示元素重新分布,并且它们在几天内继续发生漂白和坏死接触后。结论 对于使用 XFM 检查植物的研究而言,建议的辐射剂量限制对于越来越多的植物科学家进行多维测量(例如使用 XFM 进行断层扫描和重复成像)非常重要。叶子在低至 0.9 kGy 的剂量下显示元素重新分布,并且在暴露后的几天内继续发生漂白和坏死。结论 对于使用 XFM 检查植物的研究而言,建议的辐射剂量限制对于越来越多的植物科学家进行多维测量(例如使用 XFM 进行断层扫描和重复成像)非常重要。叶子在低至 0.9 kGy 的剂量下显示元素重新分布,并且在暴露后的几天内继续发生漂白和坏死。结论 对于使用 XFM 检查植物的研究而言,建议的辐射剂量限制对于越来越多的植物科学家进行多维测量(例如使用 XFM 进行断层扫描和重复成像)非常重要。
更新日期:2019-11-28
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