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Imaging defect complexes in scanning transmission electron microscopy: Impact of depth, structural relaxation, and temperature investigated by simulations.
Ultramicroscopy ( IF 2.1 ) Pub Date : 2019-11-04 , DOI: 10.1016/j.ultramic.2019.112884 Thomas Aarholt 1 , Ymir K Frodason 1 , Øystein Prytz 1
中文翻译:
在扫描透射电子显微镜中成像缺陷复合物:通过模拟研究深度,结构弛豫和温度的影响。
更新日期:2019-11-01
Ultramicroscopy ( IF 2.1 ) Pub Date : 2019-11-04 , DOI: 10.1016/j.ultramic.2019.112884 Thomas Aarholt 1 , Ymir K Frodason 1 , Øystein Prytz 1
Affiliation
中文翻译:
在扫描透射电子显微镜中成像缺陷复合物:通过模拟研究深度,结构弛豫和温度的影响。