An electron optical column has been designed for High Resolution Electron Energy Loss Microscopy (HREELM). The column is composed of electron lenses and a beam separator that are placed between an electron source based on a laser excited cesium atom beam and a time-of-flight (ToF) spectrometer or a hemispherical analyzer (HSA). The instrument will be able to perform full field low energy electron imaging of surfaces with sub-micron spatial resolution and meV energy resolution necessary for the analysis of local vibrational spectra. Thus, non-contact, real space mapping of microscopic variations in vibrational levels will be made possible. A second imaging mode will allow for the mapping of the phonon dispersion relations from microscopic regions defined by an appropriate field aperture.

中文翻译：

---

高分辨率电子能量损失显微镜的设计

为高分辨率电子能量损失显微镜 (HREELM) 设计了一种电子光学柱。该柱由放置在基于激光激发铯原子束的电子源和飞行时间 (ToF) 光谱仪或半球分析仪 (HSA) 之间的电子透镜和光束分离器组成。该仪器将能够以亚微米空间分辨率和 meV 能量分辨率对表面进行全场低能电子成像，这是分析局部振动光谱所必需的。因此，振动水平的微观变化的非接触式真实空间映射将成为可能。第二种成像模式将允许从由适当的场孔径定义的微观区域映射声子色散关系。