Over the past three decades, the widespread utility and applicability of x-ray photoelectron spectroscopy (XPS) in research and applications has made it the most popular and widely used method of surface analysis. Associated with this increased use has been an increase in the number of new or inexperienced users, which has led to erroneous uses and misapplications of the method. This article is the first in a series of guides assembled by a committee of experienced XPS practitioners that are intended to assist inexperienced users by providing information about good practices in the use of XPS. This first guide outlines steps appropriate for determining whether XPS is capable of obtaining the desired information, identifies issues relevant to planning, conducting, and reporting an XPS measurement, and identifies sources of practical information for conducting XPS measurements. Many of the topics and questions addressed in this article also apply to other surface-analysis techniques.

中文翻译：

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X 射线光电子能谱实用指南：规划、实施和报告 XPS 测量的第一步

在过去的三十年中，X射线光电子能谱（XPS）在研究和应用中的广泛实用性和适用性使其成为最受欢迎和广泛使用的表面分析方法。与这种使用增加相关的是新用户或缺乏经验的用户数量的增加，这导致了该方法的错误使用和误用。本文是由经验丰富的 XPS 从业者委员会编写的一系列指南中的第一篇，旨在通过提供有关使用 XPS 的良好实践的信息来帮助缺乏经验的用户。第一篇指南概述了用于确定 XPS 是否能够获取所需信息的适当步骤，确定与规划、实施和报告 XPS 测量相关的问题，并确定用于进行 XPS 测量的实用信息来源。本文讨论的许多主题和问题也适用于其他表面分析技术。