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Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Christian Colliex, Archie Howie and Hannes Lichte on the occasion of their 75th, 85th and 75th birthdays.
Ultramicroscopy ( IF 2.1 ) Pub Date : 2019-02-23 , DOI: 10.1016/j.ultramic.2019.02.008
Rafal E Dunin-Borkowski 1 , Joachim Mayer 2 , Carsten Sachse 1 , Karsten Tillmann 1
Affiliation  



中文翻译:

为纪念克里斯蒂安·科利克斯(Christian Colliex),阿奇·豪威(Archie Howie)和汉尼斯·里希特(Hannes Lichte)诞辰75、85和75岁,特别介绍了“像差校正电子显微镜前沿”特刊。

更新日期:2019-11-01
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