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Fourier transform ion cyclotron resonance mass spectrometry: a primer.
Mass Spectrometry Reviews ( IF 6.6 ) Pub Date : 1998-10-13 , DOI: 10.1002/(sici)1098-2787(1998)17:1<1::aid-mas1>3.0.co;2-k
A G Marshall 1 , C L Hendrickson , G S Jackson
Affiliation  

This review offers an introduction to the principles and generic applications of FT-ICR mass spectrometry, directed to readers with no prior experience with the technique. We are able to explain the fundamental FT-ICR phenomena from a simplified theoretical treatment of ion behavior in idealized magnetic and electric fields. The effects of trapping voltage, trap size and shape, and other nonidealities are manifested mainly as perturbations that preserve the idealized ion behavior modified by appropriate numerical correction factors. Topics include: effect of ion mass, charge, magnetic field, and trapping voltage on ion cyclotron frequency; excitation and detection of ICR signals; mass calibration; mass resolving power and mass accuracy; upper mass limit(s); dynamic range; detection limit, strategies for mass and energy selection for MSn; ion axialization, cooling, and remeasurement; and means for guiding externally formed ions into the ion trap. The relation of FT-ICR MS to other types of Fourier transform spectroscopy and to the Paul (quadrupole) ion trap is described. The article concludes with selected applications, an appendix listing accurate fundamental constants needed for ultrahigh-precision analysis, and an annotated list of selected reviews and primary source publications that describe in further detail various FT-ICR MS techniques and applications.

中文翻译:

傅里叶变换离子回旋共振质谱:引物。

这篇综述介绍了FT-ICR质谱的原理和一般应用,面向没有该技术的经验的读者。我们可以通过对理想磁场和电场中离子行为的简化理论处理来解释基本的FT-ICR现象。陷阱电压,陷阱尺寸和形状以及其他非理想性的影响主要表现为扰动,这些扰动保留了通过适当的数值校正因子修改后的理想离子行为。主题包括:离子质量,电荷,磁场和俘获电压对离子回旋加速器频率的影响;激发和检测ICR信号;质量校准;质量分辨能力和质量精度;质量上限;动态范围; MSn的检出限,质量和能量选择策略;离子轴向化,冷却和重新测量;用于将外部形成的离子导入离子阱的装置。描述了FT-ICR MS与其他类型的傅里叶变换光谱以及与Paul(四极)离子阱的关系。本文以选定的应用程序结尾,附录列出了超高精度分析所需的准确基本常数,以及选定评论的注释列表和主要来源出版物,这些出版物进一步详细描述了各种FT-ICR MS技术和应用程序。
更新日期:2019-11-01
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