This paper describes the advantages of using single impacts of large cluster projectiles (e.g. C(60) and Au(400)) for surface mapping and characterization. The analysis of co-emitted time-resolved photon spectra, electron distributions and characteristic secondary ions shows that they can be used as surface fingerprints for target composition, morphology and structure. Photon, electron and secondary ion emission increases with the projectile cluster size and energy. The observed, high abundant secondary ion emission makes cluster projectiles good candidates for surface mapping of atomic and fragment ions (e.g., yield >1 per nominal mass) and molecular ions (e.g., few tens of percent in the 500 < m/z < 1500 range).

中文翻译：

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使用单个簇影响进行表面映射。


本文描述了使用大型集束射弹（例如C(60) 和Au(400)）的单次撞击进行表面测绘和表征的优点。对共发射时间分辨光子光谱、电子分布和特征二次离子的分析表明，它们可以用作目标成分、形态和结构的表面指纹。光子、电子和二次离子发射随着弹丸团簇尺寸和能量的增加而增加。观察到的高丰度二次离子发射使得簇射弹成为原子和碎片离子（例如，每标称质量的产率 >1）和分子离子（例如，500 < m/z < 1500 范围内的百分之几十）表面映射的良好候选者。范围）。