Residual hydrogen (H2) gas in the analysis chamber of an atom probe instrument limits the ability to measure H concentration in metals and alloys. Measuring H concentration would permit quantification of important physical phenomena, such as hydrogen embrittlement, corrosion, hydrogen trapping, and grain boundary segregation. Increased insight into the behavior of residual H2 gas on the specimen tip surface in atom probe instruments could help reduce these limitations. The influence of user-selected experimental parameters on the field adsorption and desorption of residual H2 gas on nominally pure copper (Cu) was studied during ultraviolet pulsed laser atom probe tomography. The results indicate that the total residual hydrogen concentration, H TOT, in the mass spectra exhibits a generally decreasing trend with increasing laser pulse energy and increasing laser pulse frequency. Second-order interaction effects are also important. The pulse energy has the greatest influence on the quantity H TOT, which is consistently less than 0.1 at.% at a value of 80 pJ.

中文翻译：

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在脉冲激光原子探针层析成像过程中控制质谱图中的残留氢气。

原子探针仪器分析室中的残留氢气（H2）限制了测量金属和合金中H浓度的能力。测量H浓度可以量化重要的物理现象，例如氢脆，腐蚀，氢捕获和晶界偏析。对原子探针仪器中样品尖端表面上残留H2气体行为的深入了解可以帮助减少这些限制。研究了用户选择的实验参数对紫外脉冲激光原子探针层析成像中名义上纯铜（Cu）上残留H2气体的场吸附和解吸的影响。结果表明，总残留氢浓度H TOT 随着激光脉冲能量的增加和激光脉冲频率的增加，质谱中的γ总体上呈现出下降的趋势。二阶相互作用效应也很重要。脉冲能量对量H TOT的影响最大，在80 pJ的值下始终小于0.1 at。％。