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Structural and Ferroelectric Properties of P(VDF-TrFE) Thin Films Depending on The Annealing Temperature
Materials Letters ( IF 2.7 ) Pub Date : 2019-03-01 , DOI: 10.1016/j.matlet.2018.11.156
Jeongdae Seo , Jong Yeog Son , Woo-Hee Kim

Abstract Organic P(VDF-TrFE) 70/30 copolymer thin films were prepared on ITO/glass substrates at 110–150 °C by spin coating. All the P(VDF-TrFE) thin films exhibited ferroelectric β-phase crystallinity in X-ray diffraction analysis. The polarization-electric field hysteresis analysis revealed that the P(VDF-TrFE) thin film annealed at 140 °C has superior ferroelectric properties with a high remanent polarization of 8.02 μC/cm2. From atomic force microscopic characterization, we observed lamellar and needle-like structures in the P(VDF-TrFE) thin film annealed at 140 °C. Further, piezoelectric force microscopic measurements confirmed a much higher piezoelectric property of the P(VDF-TrFE) thin film annealed at 140 °C than those of the films annealed at other temperatures.

中文翻译:

P(VDF-TrFE) 薄膜的结构和铁电特性取决于退火温度

摘要 有机 P(VDF-TrFE) 70/30 共聚物薄膜在 110–150 °C 下通过旋涂在 ITO/玻璃基板上制备。所有 P(VDF-TrFE) 薄膜在 X 射线衍射分析中都表现出铁电 β 相结晶度。极化-电场滞后分析表明,在 140 °C 下退火的 P(VDF-TrFE) 薄膜具有优异的铁电性能,具有 8.02 μC/cm2 的高剩余极化。从原子力显微表征中,我们观察到在 140°C 下退火的 P(VDF-TrFE) 薄膜中的层状和针状结构。此外,压电力显微测量证实了在 140°C 下退火的 P(VDF-TrFE) 薄膜的压电性能比在其他温度下退火的薄膜高得多。
更新日期:2019-03-01
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