Abstract In order to increase the resolution of traditional MFM and extend its applications in the past, we created an Alternating Magnetic Force Microscopy (A-MFM) with a magnetic force modulation by applying an off-resonance AC magnetic field. A new magnetic tip has been developed for A-MFM in this work. Perpendicular magnetic recording medium with 500 kfci recording density is successfully imaged and analyzed by using the new tips coated by 6–15 nm amorphous FeCoSiB-based soft magnetic film. The effect of Si doping to the magnetic film on the A-MFM imaging was studied. It was found that Si additive had no effect on the imaging properties, such as signal-to-noise ratio and spatial resolution (kept at ∼5 nm level). But on other side, Si additive significantly degraded the chemical stability of FeCoSiB film due to oxidation in ambient atmosphere. Surface passivation by metal and boron oxides is considered to have a main effect on improvement of chemical stability of Si-free magnetic coating. The results have shown that Si-free FeCoB-based magnetic tips are appropriate candidates for A-MFM imaging in ambient conditions.

中文翻译：

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交变磁力显微镜：Si 掺杂对非晶 FeCoB 磁尖随时间性能退化的影响

摘要 为了提高传统 MFM 的分辨率并扩展其过去的应用，我们通过施加非共振交流磁场创建了具有磁力调制的交变磁力显微镜 (A-MFM)。在这项工作中为 A-MFM 开发了一种新的磁性尖端。通过使用涂有 6-15 nm 非晶 FeCoSiB 基软磁膜的新尖端，成功地对具有 500 kfci 记录密度的垂直磁记录介质进行了成像和分析。研究了磁性薄膜掺杂Si对A-MFM成像的影响。发现Si添加剂对成像特性没有影响，例如信噪比和空间分辨率（保持在~5 nm水平）。但另一方面，由于环境气氛中的氧化，Si 添加剂显着降低了 FeCoSiB 薄膜的化学稳定性。金属和硼氧化物的表面钝化被认为对提高无硅磁性涂层的化学稳定性有主要影响。结果表明，基于无硅 FeCoB 的磁性尖端是环境条件下 A-MFM 成像的合适候选者。