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Essential Effects on the Mobility Extraction Reliability for Organic Transistors
Advanced Functional Materials ( IF 18.5 ) Pub Date : 2018-08-30 , DOI: 10.1002/adfm.201803907
Yong Xu 1, 2 , Huabin Sun 1, 2 , Ao Liu 2 , Huihui Zhu 2 , Binhong Li 3 , Takeo Minari 4 , Francis Balestra 5 , Gerard Ghibaudo 5 , Yong-Young Noh 2
Affiliation  

The reliability of mobility has come to be a critical issue to the development of new electronics especially for organic electronics, since mobility is typically extracted from field‐effect transistors containing various extrinsic effects and overestimation is popular in the literature. Recently, this issue is emphasized and a reliability factor (r) is proposed by pioneers to gauge the mobility reported. Albeit many factors discussed, how much the extrinsic effects influence r remains unrevealed and a facile solution by using organic transistors is still lacking. Here, it is shown that the widely used extraction method based on the saturation transfer characteristics is sensitive to contact effect and temperature with r dropping to 43%, indeed leading to large mobility overestimation. By contrast, the linear‐regime methods are more reliable particularly the Y‐function method that demonstrates great reliability (r ≈ 100%) even for short‐channel transistors at ultralow temperatures. In addition, operating in saturation regime induces ambipolar conduction further deteriorating reliability if contact doping is absent. High Schottky barriers, on the other side, distort device characteristics making extraction impossible. The results of this study reveal that, aside from device optimizations, selecting a right method is essential for reliable and precise evaluation of the carrier mobility by using organic transistors.

中文翻译:

对有机晶体管迁移率提取可靠性的本质影响

迁移率的可靠性已成为开发新电子产品(尤其是有机电子产品)的关键问题,因为迁移率通常是从包含各种非本征效应的场效应晶体管中提取出来的,因此高估了文献。最近,这个问题得到了强调,并且先驱者提出了可靠性因子(r)来衡量报告的机动性。尽管讨论了许多因素,但仍未揭示外部效应对r的影响程度,并且仍然缺乏使用有机晶体管的简便解决方案。在此表明,基于饱和传递特性的广泛使用的提取方法对接触效应和温度与r的关系很敏感。下降到43%,确实导致大量流动性被高估。与此相反,线性政权方法更可靠特别演示极大可靠性(在Y函数法ř ≈100%),甚至在超低温度下短沟道晶体管。另外,如果不进行接触掺杂,则在饱和状态下工作会引起双极性传导,从而进一步降低可靠性。另一方面,高的肖特基势垒会扭曲器件的特性,导致无法进行提取。这项研究的结果表明,除了器件的优化之外,选择正确的方法对于通过使用有机晶体管可靠,精确地评估载流子迁移率至关重要。
更新日期:2018-08-30
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