Using in situ energy dispersive x-ray diffraction (EDXRD) the average specimen temperature of TiO₂ in the steady state of flash is experimentally determined. Comparison of the microstructure for flash sintering and conventional sintering in addition to the temperature determined from calibration of the unit cell expansion indicates that rapid Joule heating during flash sintering causes densification and grain growth comparable with conventional sintering. An average temperature approximation model is proposed to account for greybody radiation and thermal conduction. The inhomogeneity of the grain growth across the sample length is confirmed to correlate with inhomogeneity in temperature distribution and this suggests a current induced Peltier effect in n-type TiO₂.

使用原位能量色散X射线衍射（EDXRD），通过实验确定了在稳定的闪光状态下TiO ₂的平均样品温度。闪速烧结和常规烧结的微观结构的比较，除了根据晶胞膨胀的校准确定的温度外，还表明，闪速烧结期间快速的焦耳加热会导致致密化和晶粒长大，可与常规烧结相比。提出了平均温度近似模型来考虑灰体辐射和热传导。证实了整个样品长度上晶粒生长的不均匀性与温度分布的不均匀性相关，这表明电流诱导了n型TiO _2中的珀尔帖效应。