Study of the Na Storage Mechanism in Silicon Oxycarbide—Evidence for Reversible Silicon Redox Activity,Small Methods

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Study of the Na Storage Mechanism in Silicon Oxycarbide—Evidence for Reversible Silicon Redox Activity
Small Methods ( IF 10.7 ) Pub Date : 2018-08-06 , DOI: 10.1002/smtd.201800177
Xinwei Dou _{1,

2} , Daniel Buchholz _{1,

2} , Manuel Weinberger ₁ , Thomas Diemant ₃ , Maximilian Kaus _{1,

4} , Sylvio Indris _{1,

4} , Rolf J. Behm _{1,

3} , Margret Wohlfahrt‐Mehrens _{1,

5} , Stefano Passerini _{1,

2}

Affiliation

Silicon‐based compounds are interesting candidate anode materials but show only relatively low electrochemical performances with sodium. Controversial reports are available about the electrochemical interaction between Na and silicon, which encourage to investigate the mechanism in a silicon‐based material in detail. This study reports the results of a systematic investigation of the electrochemical sodium ion storage in silicon oxycarbide (SiCO) using ex situ X‐ray photoelectron spectroscopy and magic‐angle spinning nuclear magnetic resonance spectroscopy. Comparison of pristine and hydrofluoric acid‐etched silicon oxycarbide shows that the silicon oxycarbide is active itself, but not by an alloying process. Instead, results reveal an irreversible structural change and amorphization of SiCO upon the initial sodium uptake and support the existence of reversible insertion‐based reactions in the subsequent cycles.

中文翻译：

碳氧化硅中钠存储机理的研究-可逆硅氧化还原活性的证据

硅基化合物是令人感兴趣的候选阳极材料，但与钠相比仅表现出较低的电化学性能。关于钠和硅之间的电化学相互作用，有争议的报告，这鼓励人们详细研究硅基材料中的机理。这项研究报告了使用异位X射线光电子能谱和魔角旋转核磁共振波谱对碳氧化硅（SiCO）中电化学钠离子存储进行系统研究的结果。比较原始和氢氟酸蚀刻的碳氧化硅表明，碳氧化硅本身是活性的，但不是通过合金化过程生成的。反而，

更新日期：2018-08-06

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