The ability to suppress space charge accumulation at high electric fields makes nanocomposites attract significant research interest as potential insulation materials in high-voltage direct current cable development. At present, the deep trap introduced by nanoparticles is frequently applied to be responsible for the observed space charge suppression in nanocomposites. However, the experimental results that support deep-trap formation have not been rigorously examined. We therefore propose herein a simple and more direct approach based on isothermal surface potential decay combined with pulsed electro-acoustic measurements to verify the presence of deep traps in silica-based blend polyethylene nanocomposites. The results indicate that the deep traps are indeed introduced by filling nanosilica and the space charge suppression observed in the nanocomposite with a low loading ratio is caused by deeply trapped charges in the sub-surface region of specimens.The ability to suppress space charge accumulation at high electric fields makes nanocomposites attract significant research interest as potential insulation materials in high-voltage direct current cable development. At present, the deep trap introduced by nanoparticles is frequently applied to be responsible for the observed space charge suppression in nanocomposites. However, the experimental results that support deep-trap formation have not been rigorously examined. We therefore propose herein a simple and more direct approach based on isothermal surface potential decay combined with pulsed electro-acoustic measurements to verify the presence of deep traps in silica-based blend polyethylene nanocomposites. The results indicate that the deep traps are indeed introduced by filling nanosilica and the space charge suppression observed in the nanocomposite with a low loading ratio is caused by deeply trapped charges in the sub-surface region of specimens.

中文翻译：

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通过等温表面电位衰减和脉冲电声测量相结合的二氧化硅基聚乙烯纳米复合材料中深陷阱的实验证明

在高电场下抑制空间电荷积累的能力使纳米复合材料作为高压直流电缆开发中的潜在绝缘材料引起了重大的研究兴趣。目前，纳米粒子引入的深陷阱经常被用来负责观察纳米复合材料中的空间电荷抑制。然而，支持深圈闭形成的实验结果尚未经过严格审查。因此，我们在此提出了一种基于等温表面电位衰减结合脉冲电声测量的简单且更直接的方法，以验证二氧化硅基共混聚乙烯纳米复合材料中深陷阱的存在。结果表明，深陷阱确实是通过填充纳米二氧化硅引入的，并且在低负载率的纳米复合材料中观察到的空间电荷抑制是由样品亚表面区域中的深陷阱电荷引起的。抑制空间电荷积累的能力高电场使纳米复合材料作为高压直流电缆开发中的潜在绝缘材料引起了人们极大的研究兴趣。目前，纳米粒子引入的深陷阱经常被用来负责观察纳米复合材料中的空间电荷抑制。然而，支持深圈闭形成的实验结果尚未经过严格审查。因此，我们在此提出了一种基于等温表面电位衰减结合脉冲电声测量的简单且更直接的方法，以验证二氧化硅基共混聚乙烯纳米复合材料中深陷阱的存在。结果表明，深陷阱确实是通过填充纳米二氧化硅引入的，并且在具有低负载率的纳米复合材料中观察到的空间电荷抑制是由样品亚表面区域中的深陷阱电荷引起的。