Abstract Metal-matrix nanocomposites have a diverse range of applications by virtue of their improved properties. However, further improvements in the characteristics of the composites can be made if we are able to tune the properties of a single constituent of the composite. In the present work, Cu-C70 thin films were grown on glass substrate with thermal co-evaporation technique. In order to induce the surface plasmon resonance (SPR) band, the nanocomposite thin films are irradiated with 120 keV N+ ion beam at the fluence ranging from 1 × 1014 to 3 × 1016 ions/cm2. The Rutherford backscattering is used to know the thickness and concentration of the components present in the nanocomposite thin film. TEM is used to show the increase in particle size of Cu nanoparticles with the increase in the irradiation fluence. The surface analysis shows a decrease in the roughness of the film upto a fluence of 3 × 1014 ions/cm2 and then the roughness increases with the increase in fluence. The UV–visible spectrum shows the formation of SPR band at ∼630 nm at the highest fluence of 3 × 1016 ions/cm2, which is ascribed to the increase in the size of the Cu nanoparticles. The FTIR spectrum shows various bonds of copper - fullerene nanocomposite in pristine film. Raman spectroscopic investigations show the transformation of fullerene C70 matrix of Cu-C70 thin film into amorphous carbon matrix at higher fluences. XPS is also performed to show the elemental state of composite material.

中文翻译：

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Cu-富勒烯C 70 纳米复合薄膜的低能离子辐照诱导SPR

摘要 金属基纳米复合材料由于其改进的性能而具有广泛的应用。然而，如果我们能够调整复合材料单一成分的特性，就可以进一步改进复合材料的特性。在目前的工作中，Cu-C70 薄膜是用热共蒸发技术在玻璃基板上生长的。为了诱导表面等离子体共振 (SPR) 带，纳米复合薄膜用 120 keV N+ 离子束照射，通量范围为 1 × 1014 至 3 × 1016 离子/cm2。卢瑟福背向散射用于了解纳米复合薄膜中存在的成分的厚度和浓度。TEM 用于显示 Cu 纳米颗粒的粒径随着辐照通量的增加而增加。表面分析表明薄膜的粗糙度降低到 3 × 1014 离子/cm2 的注量，然后粗糙度随着注量的增加而增加。紫外-可见光谱显示在 3 × 1016 离子/cm2 的最高能量密度下在~630 nm 处形成 SPR 带，这归因于 Cu 纳米颗粒尺寸的增加。FTIR 光谱显示铜-富勒烯纳米复合材料在原始薄膜中的各种键。拉曼光谱研究表明，Cu-C70 薄膜的富勒烯 C70 基质在更高的能量密度下转变为无定形碳基质。还进行 XPS 以显示复合材料的元素状态。紫外-可见光谱显示在 3 × 1016 离子/cm2 的最高能量密度下在~630 nm 处形成 SPR 带，这归因于 Cu 纳米颗粒尺寸的增加。FTIR 光谱显示铜-富勒烯纳米复合材料在原始薄膜中的各种键。拉曼光谱研究表明，Cu-C70 薄膜的富勒烯 C70 基质在更高的能量密度下转变为无定形碳基质。还进行 XPS 以显示复合材料的元素状态。紫外-可见光谱显示在 3 × 1016 离子/cm2 的最高能量密度下在~630 nm 处形成 SPR 带，这归因于 Cu 纳米颗粒尺寸的增加。FTIR 光谱显示铜-富勒烯纳米复合材料在原始薄膜中的各种键。拉曼光谱研究表明，Cu-C70 薄膜的富勒烯 C70 基质在更高的能量密度下转变为无定形碳基质。还进行 XPS 以显示复合材料的元素状态。拉曼光谱研究表明，Cu-C70 薄膜的富勒烯 C70 基质在更高的能量密度下转变为无定形碳基质。还进行 XPS 以显示复合材料的元素状态。拉曼光谱研究表明，Cu-C70 薄膜的富勒烯 C70 基质在更高的能量密度下转变为无定形碳基质。还进行 XPS 以显示复合材料的元素状态。