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Piezoelectrics: Large Local‐Compressive Stress‐Induced Improvements in Piezoelectric Characteristics of Lead Zirconate Titanate Thin Films on a Ni Nanodots Array (Adv. Electron. Mater. 7/2018)
Advanced Electronic Materials ( IF 6.2 ) Pub Date : 2018-07-09 , DOI: 10.1002/aelm.201870033
Chan Su Han 1 , Ahra Cho 1 , Da Bin Kim 1 , Yong Soo Cho 1
Affiliation  

As described by Yong Soo Cho and co‐workers in article number 1800081, a nanodot array on a regular substrate induces extra local compressive stress and promising crystal orientation during in situ deposition of piezoelectric thin films. Uniformity of the nanodot array is secured with the aid of a magnetic field. The ideal growth orientation results in a significant improvement of effective piezoelectric coefficient.
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中文翻译:

压电:Ni纳米点阵列上锆钛酸铅钛薄膜的压电特性的大局部压缩应力诱导改进(Adv。Electron。Mater。7/2018)

如Yong Soo Cho及其同事在文章编号1800081中所述,在压电薄膜的原位沉积过程中,规则基板上的纳米点阵列会引起额外的局部压应力和有希望的晶体取向。借助于磁场确保纳米点阵列的均匀性。理想的生长取向导致有效压电系数的显着改善。
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更新日期:2018-07-09
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