Encapsulation-Free Stabilization of Few-Layer Black Phosphorus,ACS Applied Materials & Interfaces

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Encapsulation-Free Stabilization of Few-Layer Black Phosphorus
ACS Applied Materials & Interfaces ( IF 8.3 ) Pub Date : 2018-07-02 00:00:00 , DOI: 10.1021/acsami.8b04180
Christopher Elbadawi ₁ , Roger Tormo Queralt ₁ , Zai-Quan Xu ₁ , James Bishop ₁ , Taimur Ahmed , Sruthi Kuriakose , Sumeet Walia , Milos Toth ₁ , Igor Aharonovich ₁ , Charlene J. Lobo ₁

Affiliation

Under ambient conditions and in H₂O and O₂ environments, reactive oxygen species (ROS) cause immediate degradation of the mobility of few-layer black phosphorus (FLBP). Here, we show that FLBP degradation can be prevented by maintaining the temperature in the range ∼125–300 °C during ROS exposure. FLBP devices maintained at elevated temperature show no deterioration of electrical conductance, in contrast to the immediate degradation of pristine FLBP held at room temperature. Our results constitute the first demonstration of stable FLBP in the presence of ROS without requiring encapsulation or a protective coating. The stabilization method will enable applications based on the surface properties of intrinsic FLBP.

中文翻译：

少层黑磷的无封装稳定化

在环境条件下以及在H ₂ O和O ₂环境中，活性氧（ROS）会立即导致几层黑磷（FLBP）的迁移率下降。在这里，我们表明通过在ROS暴露期间将温度保持在约125-300°C可以防止FLBP降解。与保持在室温下的原始FLBP立即降解相比，保持在高温下的FLBP器件没有显示出电导率的下降。我们的结果首次证明了在存在ROS的情况下稳定的FLBP，而无需封装或保护性涂层。稳定化方法将使基于固有FLBP的表面特性的应用成为可能。

更新日期：2018-07-02

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