It is important to characterize photocatalysts by in-situ techniques. In this work, the high pressure temperature-programmed in-situ Fourier Transform Infrared Diffuse Reflection Spectroscopy (FTIR-DRS) was employed to evaluate shallow trap states in Cu-doped TiO₂ photocatalyst. It was demonstrated that the formation of the shallow trap state by reduction is much easier for CuO/TiO₂ than pure TiO₂. Furthermore, the formation temperature of the shallow trap state for CuO/TiO₂ is the same as its starting reduction temperature of Cu²⁺ to Cu⁺, which indicates that the generated shallow trap state might be Cu⁺.

中文翻译：

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铜掺杂TiO ₂光催化剂浅陷阱态的原位FTIR-DRS研究

通过原位技术表征光催化剂很重要。在这项工作中，采用高压程序升温原位傅里叶变换红外漫反射光谱（FTIR-DRS）来评估Cu掺杂的TiO ₂光催化剂中的浅陷阱态。结果表明，与纯TiO ₂相比，CuO / TiO ₂通过还原形成浅陷阱态要容易得多。此外，CuO / TiO ₂的浅陷阱态的形成温度与其从Cu ²⁺到Cu ^+的初始还原温度相同，这表明产生的浅陷阱态可能是Cu ⁺。