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Experimental evidence of the thickness- and electric-field-dependent topological phase transitions in topological crystalline insulator SnTe(111) thin films
Nano Research ( IF 9.5 ) Pub Date : 2018-06-23 , DOI: 10.1007/s12274-018-2120-y Yan Gong , Kejing Zhu , Zhe Li , Yunyi Zang , Xiao Feng , Ding Zhang , Canli Song , Lili Wang , Wei Li , Xi Chen , Xu-Cun Ma , Qi-Kun Xue , Yong Xu , Ke He
Nano Research ( IF 9.5 ) Pub Date : 2018-06-23 , DOI: 10.1007/s12274-018-2120-y Yan Gong , Kejing Zhu , Zhe Li , Yunyi Zang , Xiao Feng , Ding Zhang , Canli Song , Lili Wang , Wei Li , Xi Chen , Xu-Cun Ma , Qi-Kun Xue , Yong Xu , Ke He
None
中文翻译：
拓扑晶体绝缘子SnTe（111）薄膜中与厚度和电场有关的拓扑相变的实验证据
没有任何
更新日期：2018-06-27
中文翻译：
拓扑晶体绝缘子SnTe（111）薄膜中与厚度和电场有关的拓扑相变的实验证据
没有任何
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