Nanowire Arrays as Force Sensors with Super‐Resolved Localization Position Detection: Application to Optical Measurement of Bacterial Adhesion Forces,Small Methods

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Nanowire Arrays as Force Sensors with Super‐Resolved Localization Position Detection: Application to Optical Measurement of Bacterial Adhesion Forces
Small Methods ( IF 10.7 ) Pub Date : 2018-06-12 , DOI: 10.1002/smtd.201700411
Aldeliane M. da Silva ₁ , Prasana K. Sahoo ₁ , Alessandro Cavalli ₂ , Alessandra A. de Souza ₃ , Erik P. A. M. Bakkers ₂ , Carlos L. Cesar ₄ , Richard Janissen ₅ , Monica A. Cotta ₁

Affiliation

The design and application of indium phosphide (InP) nanowire arrays to acquire Xylella fastidiosa bacterial cell vector force maps are discussed. The nanowire deflections are measured with subdiffraction localization confocal laser scanning microscopy (CLSM). The nanowire mechanical stability in air and liquid media as well as methods to average out thermally induced oscillations are investigated. The accuracy of center determination of the CLSM reflected laser intensity profile at nanowire apex is studied using Gaussian fitting and localization microscopy techniques. These results show that the method is reliable for measuring nanowire displacements above ≈25 nm. Corresponding force ranges probed by this method can be customized depending on nanowire geometry and array configuration. The method is applied to explore X. fastidiosa cell adhesion forces on the InP nanowire surface, and in situ probes the effect of N‐acetylcysteine on adhered cells. Future perspectives for application of this method in microbiology studies are also outlined.

中文翻译：

纳米线阵列作为具有超分辨定位位置检测的力传感器：在细菌粘附力的光学测量中的应用

磷化铟（InP）纳米线阵列的设计和应用来获取叶缘焦枯病菌细菌细胞矢量力图进行了讨论。纳米线偏转是通过亚衍射定位共聚焦激光扫描显微镜（CLSM）进行测量的。研究了纳米线在空气和液体介质中的机械稳定性以及使热引起的振荡平均化的方法。使用高斯拟合和定位显微镜技术研究了CLSM反射激光强度分布在纳米线顶点中心确定的准确性。这些结果表明，该方法对于测量≈25nm以上的纳米线位移是可靠的。可以根据纳米线的几何形状和阵列配置来定制通过此方法探测的相应力范围。该方法用于探索X. fastidiosaInP纳米线表面上的细胞粘附力，并原位探测N乙酰半胱氨酸对粘附细胞的影响。还概述了该方法在微生物学研究中的应用前景。

更新日期：2018-06-12

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