Abstract One-dimensional Cu 3 BiS 3 nano-and microstructures were synthesized by solvothermal route using structural directing agent polyethylene glycol (PEG) as soft template. The effects of thiourea concentration on the morphological, structural and optical properties of Cu 3 BiS 3 nano- and microstructures were investigated. X-ray diffraction study revealed that the synthesized Cu 3 BiS 3 belongs to orthorhombic structure. Raman spectrum of the Cu 3 BiS 3 exhibited its functional groups. The chemical bonding of the ions was examined by X-ray photoelectron spectroscopy. Field emission scanning electron microscope and transmission electron microscope analyses evidently showed that thiourea concentration acts as a crucial factor in tuning the morphology of Cu 3 BiS 3 nano- and microstructures. The presence of Cu 3 BiS 3 was confirmed by Energy Dispersive X-ray Analysis and elemental mapping. The growth mechanism of Cu 3 BiS 3 nanostructures has been discussed. Conductivity of Cu 3 BiS 3 measured by I-V characteristics of the nano- and microstructured film of ~ 2.5 µm thickness deposited on FTO substrate using electron beam evaporation method showed linear curve. The Hall measurements of the Cu 3 BiS 3 films deposited on glass substrate were determined.

中文翻译：

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PEG辅助溶剂热法合成Cu 3 BiS 3 纳米和微结构的形状控制和功能特性

摘要 以结构导向剂聚乙二醇(PEG)为软模板，通过溶剂热法合成了一维Cu 3 BiS 3 纳米和微结构。研究了硫脲浓度对Cu 3 BiS 3 纳米和微结构的形态、结构和光学性能的影响。X射线衍射研究表明合成的Cu 3 BiS 3 属于正交结构。Cu 3 BiS 3 的拉曼光谱显示出其官能团。通过X射线光电子能谱检查离子的化学键合。场发射扫描电子显微镜和透射电子显微镜分析明显表明硫脲浓度是调节Cu 3 BiS 3 纳米和微结构形态的关键因素。Cu 3 BiS 3 的存在通过能量色散X射线分析和元素分布图确认。讨论了Cu 3 BiS 3 纳米结构的生长机制。Cu 3 BiS 3 的电导率通​​过使用电子束蒸发方法沉积在 FTO 基板上的约 2.5 µm 厚度的纳米和微结构膜的 IV 特性测量显示出线性曲线。测定沉积在玻璃基板上的Cu 3 BiS 3 膜的霍尔测量值。