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Tuning the electronic property of two dimensional SiSe monolayer by in-plane strain
Chemical Physics Letters ( IF 2.8 ) Pub Date : 2018-05-21 , DOI: 10.1016/j.cplett.2018.05.042
Yuliang Mao , Jiao Ben , Jianmei Yuan , Jianxin Zhong

Using first-principles calculations, the electronic properties of SiSe monolayer under in-plane strains are studied. It is found that the band gap of SiSe monolayer is increased linearly under the tensile strains along armchair direction. The tensile strain of 7% along zigzag direction makes a transition of band gap from indirect to direct. Under the biaxial compressive strains from 0% to -5%, we found that the band gap of SiSe monolayer is decreased continuously. Moreover, the SiSe monolayer exhibits metallic behavior under the -5% biaxial compressive strain.



中文翻译:

通过面内应变调整二维SiSe单层的电子性质

使用第一性原理计算,研究了平面内应变下SiSe单层的电子性质。发现在沿扶手椅方向的拉伸应变下,SiSe单层的带隙线性增加。沿之字形方向的7%拉伸应变使带隙从间接转变为直接。在从0%到-5%的双轴压缩应变下,我们发现SiSe单层的带隙不断减小。而且,SiSe单层在-5%的双轴压缩应变下表现出金属性能。

更新日期:2018-05-21
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