Raman Signatures of Broken Inversion Symmetry and In‐Plane Anisotropy in Type‐II Weyl Semimetal Candidate TaIrTe4,Advanced Materials

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Raman Signatures of Broken Inversion Symmetry and In‐Plane Anisotropy in Type‐II Weyl Semimetal Candidate TaIrTe4
Advanced Materials ( IF 27.4 ) Pub Date : 2018-05-07 , DOI: 10.1002/adma.201706402
Yinan Liu ₁ , Qiangqiang Gu ₁ , Yu Peng ₂ , Shaomian Qi ₁ , Na Zhang ₃ , Yinong Zhang ₁ , Xiumei Ma ₄ , Rui Zhu ₄ , Lianming Tong ₃ , Ji Feng _{1,

5,

6} , Zheng Liu _{2,

7} , Jian‐Hao Chen _{1,

6}

Affiliation

The layered ternary compound TaIrTe₄ is an important candidate to host the recently predicted type‐II Weyl fermions. However, a direct and definitive proof of the absence of inversion symmetry in this material, a prerequisite for the existence of Weyl Fermions, has so far remained evasive. Herein, an unambiguous identification of the broken inversion symmetry in TaIrTe₄ is established using angle‐resolved polarized Raman spectroscopy. Combining with high‐resolution transmission electron microscopy, an efficient and nondestructive recipe to determine the exact crystallographic orientation of TaIrTe₄ crystals is demonstrated. Such technique could be extended to the fast identification and characterization of other type‐II Weyl fermions candidates. A surprisingly strong in‐plane electrical anisotropy in TaIrTe₄ thin flakes is also revealed, up to 200% at 10 K, which is the strongest known electrical anisotropy for materials with comparable carrier density, notably in such good metals as copper and silver.

中文翻译：

II型Weyl半金属候选TaIrTe4的破裂反演对称性和面内各向异性的拉曼特征

层状三元化合物TaTerTe ₄是容纳最近预测的II型Weyl费米子的重要候选者。然而，迄今为止，仍然存在对这种材料中不存在反演对称性的直接和确定的证据，这是存在韦尔费米子的前提。在此，使用角度分辨偏振拉曼光谱技术确定了TaIrTe _4中反演对称性的明确识别。结合高分辨率透射电子显微镜，一种有效且无损的配方，可确定TaTerTe ₄的确切晶体取向展示了晶体。这种技术可以扩展到其他II型Weyl费米子候选物的快速鉴定和表征。还发现了TaTerTe ₄薄片中惊人的面内电各向异性，在10 K时高达200％，对于具有可比的载流子密度的材料，尤其是在铜和银等良好的金属中，这是已知的最强的电各向异性。

更新日期：2018-05-07

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