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Single-shot super-resolution total internal reflection fluorescence microscopy.
Nature Methods ( IF 36.1 ) Pub Date : 2018-05-07 , DOI: 10.1038/s41592-018-0004-4
Min Guo 1 , Panagiotis Chandris 1 , John Paul Giannini 1, 2 , Adam J Trexler 3, 4 , Robert Fischer 3 , Jiji Chen 5 , Harshad D Vishwasrao 5 , Ivan Rey-Suarez 1, 2 , Yicong Wu 1 , Xufeng Wu 3 , Clare M Waterman 3 , George H Patterson 6 , Arpita Upadhyaya 7 , Justin W Taraska 3 , Hari Shroff 1, 5, 7
Affiliation  

We combined instant structured illumination microscopy (iSIM) with total internal reflection fluorescence microscopy (TIRFM) in an approach referred to as instant TIRF-SIM, thereby improving the lateral spatial resolution of TIRFM to 115 ± 13 nm without compromising speed, and enabling imaging frame rates up to 100 Hz over hundreds of time points. We applied instant TIRF-SIM to multiple live samples and achieved rapid, high-contrast super-resolution imaging close to the coverslip surface.



中文翻译:

单次超分辨率全内反射荧光显微镜。

我们将即时结构照明显微镜 (iSIM) 与全内反射荧光显微镜 (TIRFM) 结合起来,称为即时 TIRF-SIM,从而在不影响速度的情况下将 TIRFM 的横向空间分辨率提高到 115 ± 13 nm,并实现成像帧在数百个时间点上速率高达 100 Hz。我们将即时 TIRF-SIM 应用于多个活体样本,并在靠近盖玻片表面的位置实现了快速、高对比度的超分辨率成像。

更新日期:2018-05-08
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