Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters,Journal of Analytical Atomic Spectrometry

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Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters
Journal of Analytical Atomic Spectrometry ( IF 3.1 ) Pub Date : 2018-05-07 00:00:00 , DOI: 10.1039/c8ja00046h
Rainer Unterumsberger _{1,

2,

3} , Philipp Hönicke _{1,

2,

3} , Julien L. Colaux _{4,

5} , Chris Jeynes _{4,

5} , Malte Wansleben _{1,

2,

3} , Matthias Müller _{1,

2,

3} , Burkhard Beckhoff _{1,

2,

3}

Affiliation

The fluorescence yield of the K- and L3-shell of gallium was determined using the radiometrically calibrated (reference-free) X-ray fluorescence instrumentation at the BESSY II synchrotron radiation facility. Simultaneous transmission and fluorescence signals from GaSe foils were obtained, resulting in K- and L3-shell fluorescence yield values (ω_Ga,K = 0.515 ± 0.019, ω_Ga,L3 = 0.013 ± 0.001) consistent with existing database values. For the first time, these standard combined uncertainties are obtained from a properly constructed Uncertainty budget. These K-shell fluorescence yield values support Bambynek's semi-empirical compilation from 1972: these and other measurements yield a combined recommended value of ω_Ga,K = 0.514 ± 0.010. Using the measured fluorescence yields together with production yields from reference Ga-implanted samples where the quantity of implanted Ga was determined at 1.3% traceable accuracy by Rutherford backscattering spectrometry, the K-shell and L3-subshell photoionization cross sections at selected incident photon energies were also determined and compared critically with the standard databases.

中文翻译：

精确实验确定镓K和L3壳XRF基本参数

使用在BESSY II同步加速器辐射设施中经过辐射校准（无参考）的X射线荧光仪器确定镓的K和L3壳的荧光产量。从GaSe箔获得了同时的透射和荧光信号，得到的K和L3壳荧光产量值（ωGa _，K = 0.515±0.019，ωGa _，L3 = 0.013±0.001）与现有数据库值一致。这些标准组合的不确定性第一次是从正确构造的不确定性预算中获得的。这些K壳层荧光屈服值支持Bambynek的半经验汇编从1972：这些和其它测量得到的组合推荐值ω_镓，K= 0.514±0.010。使用所测量的荧光产率以及参考Ga注入样品的产率，其中通过Rutherford反向散射光谱法以1.3％的可追溯精度确定Ga的注入量，在选定入射光子能量下的K壳和L3亚壳光电离截面为还确定并与标准数据库进行严格比较。

更新日期：2018-05-07

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