This paper presents an analytical scheme that combines spark-induced breakdown spectroscopy with particle flow (PF-SIBS) for the real-time measurement of the constituents in powdered materials. With high voltage power supply instruments, a vibrational feeder and a spectrometer, the measuring system is low-cost and robust. To demonstrate its applicability, particle samples with varied carbon content were tested in LIBS and PF-SIBS for the comparison of their relative standard deviation (RSD), false spectra ratio, signal-to-noise ratio (SNR) and calibration results. The RSD of the C I 247.86 nm line in LIBS ranged from 35.72% to 62.51% for eight samples, while for PF-SIBS it ranged from 19.63% to 46.57%. The SNR of the Si I 288.15 nm was set as the index for the partial breakdown spectral identification and about 10% of the spectra were identified as false in LIBS, while all the spectra were identified as true spectra in PF-SIBS. The SNR of the C line in PF-SIBS was enhanced by 4 times as compared with LIBS. Since lines emitted from the tungsten electrode are inevitable, a correction method was employed to correct the interference between the C I 247.86 nm and W II 247.77 nm lines. The correlation coefficient, R², of the linear multivariate calibration of LIBS was 0.957, while that of PF-SIBS was greater than 0.990 and can reach 0.995 after C–W interference correction. With interference correction in PF-SIBS, the average absolute error of the sample validation was 0.38% and the limit of detection (LOD) was 0.46%. These results demonstrate the feasibility of PF-SIBS as a powerful detection technology for the real-time measurement of the constituents in powdered materials and the interference correction can improve the measurement effect at low concentration.

中文翻译：

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使用粒子流火花诱导击穿光谱法实时测量固体材料中的成分

本文提出了一种结合火花感应击穿光谱和颗粒流（PF-SIBS）的分析方案，用于实时测量粉末材料中的成分。借助高压电源仪表，振动馈线和光谱仪，该测量系统不仅成本低廉，而且坚固耐用。为了证明其适用性，在LIBS和PF-SIBS中对碳含量不同的颗粒样品进行了测试，以比较其相对标准偏差（RSD），假光谱比，信噪比（SNR）和校准结果。对于八个样品，LIBS中的CI 247.86 nm线的RSD为35.72％至62.51％，而PF-SIBS的RSD为19.63％至46.57％。Si I 288的SNR。将15 nm设置为部分击穿光谱识别的指标，在​​LIBS中将约10％的光谱识别为假，而在PF-SIBS中将所有光谱识别为真实光谱。与LIBS相比，PF-SIBS中C线的SNR提高了4倍。由于从钨电极发出的线是不可避免的，因此采用校正方法来校正CI 247.86 nm和W II 247.77 nm线之间的干涉。相关系数LIBS的线性多元校正的R ²为0.957，而PF-SIBS的线性多元校正大于0.990，经过C–W干扰校正后可以达到0.995。通过PF-SIBS中的干扰校正，样品验证的平均绝对误差为0.38％，检出限（LOD）为0.46％。这些结果证明了PF-SIBS作为一种强大的检测技术，可以实时测量粉末材料中的成分的可行性，并且干扰校正可以改善低浓度下的测量效果。