Substituting heteroatoms into nanostructured graphene elements, such as graphene nanoribbons, offers the possibility for atomic engineering of electronic properties. To characterize these substitutions, functionalized atomic force microscopy (AFM)-a tool to directly resolve chemical structures-is one of the most promising tools, yet the chemical analysis of heteroatoms has been rarely performed. We synthesized multiple heteroatom-substituted graphene nanoribbons and showed that AFM can directly resolve elemental differences and can be correlated to the van der Waals radii, as well as the modulated local electron density caused by the substitution. This elemental-sensitive measurement takes an important step in the analysis of functionalized two-dimensional carbon materials.

中文翻译：

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多个杂原子取代石墨烯纳米带。

将杂原子替代成纳米结构的石墨烯元素，例如石墨烯纳米带，为电子性质的原子工程化提供了可能性。为了表征这些取代，功能化原子力显微镜（AFM）（一种直接解析化学结构的工具）是最有前途的工具之一，但很少进行杂原子的化学分析。我们合成了多个杂原子取代的石墨烯纳米带，并表明AFM可以直接解决元素差异，并且可以与范德华半径以及取代引起的调制局部电子密度相关。这种元素敏感的测量在功能化二维碳材料的分析中迈出了重要的一步。