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Design and Realization of 3D Printed AFM Probes
Small ( IF 13.0 ) Pub Date : 2018-03-30 , DOI: 10.1002/smll.201800162
Nourin Alsharif 1 , Anna Burkatovsky 1 , Charles Lissandrello 1 , Keith M. Jones 2 , Alice E. White 1, 3 , Keith A. Brown 1, 3
Affiliation  

Atomic force microscope (AFM) probes and AFM imaging by extension are the product of exceptionally refined silicon micromachining, but are also restricted by the limitations of these fabrication techniques. Here, the nanoscale additive manufacturing technique direct laser writing is explored as a method to print monolithic cantilevered probes for AFM. Not only are 3D printed probes found to function effectively for AFM, but they also confer several advantages, most notably the ability to image in intermittent contact mode with a bandwidth approximately ten times larger than analogous silicon probes. In addition, the arbitrary structural control afforded by 3D printing is found to enable programming the modal structure of the probe, a capability that can be useful in the context of resonantly amplifying nonlinear tip–sample interactions. Collectively, these results show that 3D printed probes complement those produced using conventional silicon micromachining and open the door to new imaging techniques.

中文翻译:

3D打印AFM探针的设计与实现

原子力显微镜(AFM)探针和扩展的AFM成像是极其精细的硅微加工的产物,但也受到这些制造技术的局限性的限制。在这里,探索了纳米级增材制造技术直接激光写入作为一种打印用于AFM的单片悬臂式探针的方法。发现3D打印探针不仅可以有效地用于AFM,而且还具有多种优势,最显着的特点是能够以间歇接触模式成像,其带宽大约是类似硅探针的十倍。此外,发现3D打印提供的任意结构控制可以对探针的模态结构进行编程,该功能在共振放大非线性探针与样品之间的相互作用的情况下很有用。
更新日期:2018-03-30
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