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Thickness driven spin reorientation transition of epitaxial LaCrO3 films
Applied Physics Letters ( IF 4 ) Pub Date : 2018-03-12 , DOI: 10.1063/1.5021950
Junho Park 1, 2 , Dong-Hwan Kim 1, 2 , Doopyo Lee 1, 2 , Kyung-Tae Ko 1, 2 , Jong Hyun Song 3 , Jae-Young Kim 4 , Tae-Yeong Koo 4 , Seung Ran Lee 2 , Jae-Hoon Park 1, 2, 5
Affiliation  

We grew fully strained epitaxial LaCrO3 (LCO) films on SrTiO3(001) under layer-by-layer control up to the film thickness of t = 130 nm using a pulsed laser deposition method. The spin axis of the antiferromagnetic LCO film was systematically examined as a function of t by using Cr L2,3-edge x-ray magnetic linear dichroism (XMLD). The XMLD results manifest a spin reorientation transition (SRT) across a transition thickness of tT ∼ 60 nm. This SRT is well explained in terms of two competing magnetic anisotropy energies of the surface/interface (KS) and the LCO film itself (KV).

中文翻译:

外延 LaCrO3 薄膜的厚度驱动自旋重定向转变

我们使用脉冲激光沉积方法在逐层控制下在 SrTiO3(001) 上生长完全应变的外延 LaCrO3 (LCO) 薄膜,薄膜厚度达到 t = 130 nm。反铁磁 LCO 膜的自旋轴作为 t 的函数通过使用 Cr L2,3 边缘 X 射线磁性线性二色性 (XMLD) 进行系统检查。XMLD 结果表明在 tT ~ 60 nm 的过渡厚度上发生了自旋重定向过渡 (SRT)。这种 SRT 可以用表面/界面 (KS) 和 LCO 膜本身 (KV) 的两个相互竞争的磁各向异性能量来很好地解释。
更新日期:2018-03-12
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