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Defect-rich, boron-nitrogen bonds-free and dual-doped graphenes for highly efficient oxygen reduction reaction
Journal of Colloid and Interface Science ( IF 9.4 ) Pub Date : 2018-03-08 , DOI: 10.1016/j.jcis.2018.03.022
Weiming Wu , Jiugou Leng , Hailong Mei , Shubin Yang

Defect-rich, boron (B) and nitrogen (N) dual-doped and inert BN covalent bonds-free graphenes (BNGs) can be successfully synthesized via a method of two-step doping combined with chemical etching. B and N doping degree and surface areas of BNGs can be enhanced facilely by chemical etching without forming inert covalent BN bonds. The as-obtained porous BNGs deliver more superior electro-catalytic activity for oxygen reduction reaction than the unetched BNGs and commercial Pt/C catalysts.



中文翻译:

富含缺陷,无硼氮键的双掺杂石墨烯,可实现高效的氧还原反应

可以通过两步掺杂与化学刻蚀相结合的方法,成功地合成出富含缺陷,硼(B)和氮(N)的双掺杂惰性B N共价键无石墨烯(BNG)。BNG的B和N掺杂度和表面积可以通过化学刻蚀方便地提高,而不会形成惰性的共价B N键。与未蚀刻的BNG和市售的Pt / C催化剂相比,如此获得的多孔BNG对氧还原反应具有更优异的电催化活性。

更新日期:2018-03-08
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