Abstract We evaluated the crystal size, shape, and alignment of the lattice planes of CuCl quantum dots (QDs) embedded in NaCl single crystals by optical measurements, X-ray diffraction (XRD) patterns, and transmission electron microscopy (TEM). We obtained, for the first time, an XRD pattern and TEM images for CuCl QDs in NaCl crystals. The XRD pattern showed that the lattice planes of the CuCl QDs were parallel to those of the NaCl crystals. In addition, the size of the QDs was estimated from the diffraction width. It was apparent from the TEM images that almost all CuCl QDs were polygonal, although some cubic QDs were present. The mean size and size distribution of the QDs were also obtained. The dot size obtained from optical measurements, XRD, and TEM image were almost consistent. Our new findings can help to reveal the growth mechanism of semiconductor QDs embedded in a crystallite matrix. In addition, this work will play an important role in progressing the study of optical phenomena originating from assembled semiconductor QDs.

中文翻译：

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通过光学测量、X 射线衍射和透射电子显微镜表征在 NaCl 单晶中生长的 CuCl 量子点

摘要 我们通过光学测量、X 射线衍射 (XRD) 图案和透射电子显微镜 (TEM) 评估了嵌入 NaCl 单晶中的 CuCl 量子点 (QD) 的晶格平面的晶体尺寸、形状和排列。我们首次获得了 NaCl 晶体中 CuCl QD 的 XRD 图案和 TEM 图像。XRD 谱表明，CuCl QD 的晶格平面与 NaCl 晶体的晶格平面平行。此外，量子点的大小是根据衍射宽度估计的。从 TEM 图像中可以明显看出，尽管存在一些立方 QD，但几乎所有 CuCl QD 都是多边形。还获得了量子点的平均尺寸和尺寸分布。从光学测量、XRD 和 TEM 图像获得的点尺寸几乎一致。我们的新发现有助于揭示嵌入微晶基质中的半导体 QD 的生长机制。此外，这项工作将在推进源自组装半导体 QD 的光学现象的研究中发挥重要作用。