When using a beam to make a measurement in situ, irrespective of scale, the process implicitly includes the taking of a sample. Therefore, the uncertainty of the measurement result needs to include the uncertainty generated by the sampling process, which is usually dominated by the heterogeneity of the analyte at that scale. Reliable estimates of the uncertainty of beam measurements are essential to judge their fitness-for-purpose (FFP) and hence to enable their rigorous interpretation. This approach can be applied to a wide range of techniques for the analytical assessments of materials, from handheld portable X-ray Fluorescence (pXRF) at the millimeter scale, to Secondary Ion Mass Spectrometry (SIMS) at the micron scale.

中文翻译：

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光束采样：在微尺度上采样

当使用光束进行原位测量时，无论规模如何，该过程都隐含了采样的过程。因此，测量结果的不确定度需要包括由采样过程产生的不确定度，通常由该规模的分析物的异质性决定。可靠地估计波束测量的不确定性对于判断它们的适用性（FFP）并因此进行严格的解释至关重要。这种方法可以应用于多种材料的分析评估技术，从毫米级的手持式便携式X射线荧光（pXRF）到微米级的二次离子质谱（SIMS）。