Abstract A portable X-ray powder diffractometer (p-XRD) PT-APXRD III has been developed for on-site analysis of paintings and archaeological samples. By using a Cu anode X-ray tube and a silicon drift diode (SDD) detector, diffraction patterns with a high signal-noise (S/N) ratio can be recorded. The X-ray tube can be operated at a maximum voltage of 60 kV, which makes it possible to simultaneously record X-ray fluorescence spectra up to the high-energy region. The total weight of this instrument is 16 kg, which can be carried anywhere and the goniometer unit (5.6 kg) can be placed on a tripod for analysis of mural paintings. We brought the instrument to the Rijksmuseum in the Netherlands to examine its applicability for the analysis of oil paintings. We successfully analyzed two seventeenth-century oil paintings by Johannes Vermeer and Jan Davidsz de Heem (copy after). Ultramarine blue, lead-tin yellow type I, and Naples yellow were identified from the diffraction patterns, demonstrating the high practicality of this instrument. Furthermore, it was found from the SEM-EDX analysis of a paint cross section that the yellow pigment was applied in separate layers rather than being mixed. This diffractometer will be commercially available in the near future and will have many applications in the field of material analysis.

中文翻译：

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新型便携式 X 射线粉末衍射仪的研制及其对两幅选定的国立博物馆老大师画作现场分析的演示

摘要 便携式 X 射线粉末衍射仪 (p-XRD) PT-APXRD III 已开发用于绘画和考古样品的现场分析。通过使用铜阳极 X 射线管和硅漂移二极管 (SDD) 探测器，可以记录具有高信噪 (S/N) 比的衍射图案。X 射线管可以在最高 60 kV 的电压下运行，这使得可以同时记录高达高能区的 X 射线荧光光谱。该仪器总重量为16公斤，可随身携带，测角单元（5.6公斤）可放置在三脚架上进行壁画分析。我们将该仪器带到荷兰国立博物馆，以检验其对油画分析的适用性。我们成功地分析了 Johannes Vermeer 和 Jan Davidsz de Heem 的两幅 17 世纪油画（后复制）。从衍射图谱中鉴定出群青蓝、铅锡黄I型和那不勒斯黄，表明该仪器具有较高的实用性。此外，从油漆横截面的 SEM-EDX 分析中发现，黄色颜料是在单独的层中施加而不是混合在一起。这种衍射仪将在不久的将来上市，并将在材料分析领域有许多应用。通过对油漆横截面的 SEM-EDX 分析发现，黄色颜料是在单独的层中施加而不是混合在一起。这种衍射仪将在不久的将来上市，并将在材料分析领域有许多应用。通过对油漆横截面的 SEM-EDX 分析发现，黄色颜料是在单独的层中涂抹而不是混合在一起。这种衍射仪将在不久的将来上市，并将在材料分析领域有许多应用。