Chemical Physics Letters ( IF 2.8 ) Pub Date : 2018-02-16 , DOI: 10.1016/j.cplett.2018.02.049 S. Rada , E. Culea , M. Rada
Samples in the 5Fe2O3·10SiO2·xY2O3·(85-x)ZrO2 composition where x=5, 10 and 15mol% Y2O3 were synthetized and investigated by XRD, SEM, density measurements, FTIR, UV-Vis, EPR and PL spectroscopies. X-ray diffraction patterns confirm the presence of the tetragonal and cubic ZrO2 crystalline phases in all samples.
The IR data show the overlaps of absorption bands assigned to Zr-O-Zr and Si-O-Si linkages in samples. UV-Vis and PL data indicate higher concentrations of intrinsic defects by doping with Y2O3 concentrations. The EPR spectra are characterized by two resonance lines situated at about g∼4.3 and g∼2 for lower Y2O3 contents.
中文翻译:
Fe 2 O 3,SiO 2和Y 2 O 3稳定的新型ZrO 2基陶瓷
合成了x = 5、10和15mol%Y 2 O 3的5Fe 2 O 3 ·10SiO 2 ·xY 2 O 3 ·(85-x)ZrO 2组成的样品,并通过XRD,SEM,密度测量,FTIR进行了研究,UV-Vis,EPR和PL光谱。X射线衍射图证实在所有样品中均存在四方和立方ZrO 2结晶相。
红外数据显示了分配给样品中Zr-O-Zr和Si-O-Si键的吸收带的重叠。UV-Vis和PL数据表明,通过掺杂Y 2 O 3浓度可以提高固有缺陷的浓度。EPR光谱的特征在于,对于较低的Y 2 O 3含量,两条共振线位于大约g〜4.3和g〜2 。