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Semiconductors: Crystal Imperfection Modulation Engineering for Functionalization of Wide Band Gap Semiconductor Radiation Detector (Adv. Electron. Mater. 2/2018)
Advanced Electronic Materials ( IF 5.3 ) Pub Date : 2018-02-12 , DOI: 10.1002/aelm.201870010
Xu Ji 1 , Liang Chen 2 , Mengxuan Xu 3 , Mei Dong 1 , Kun Yan 1 , Shuang Cheng 4 , Xueqian Kong 5 , Tongyao Wang 5 , Jiandang Liu 6 , Bingchuan Gu 6 , Huanhua Wang 7 , Zhiyong Liu 8 , Shuao Wang 8 , Feng Huang 1 , Xiaoping Ouyang 2
Affiliation  

Controllable and repeatable crystal‐imperfection‐modulation engineering (CIME) is important for the development of semiconductor science and technology. A universal and feasible CIME for ZnO based on creative electrochemical doping and strong oxidizing thermodynamic annealing processes is described by Feng Huang, Xiaoping Ouyang, and co‐workers in article number 1700307. Their method could be of major benefit for new wide‐band‐gap semiconductor devices.
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中文翻译:

半导体:用于宽带隙半导体辐射检测器功能化的晶体缺陷调制工程(Adv。Electron。Mater。2/2018)

可控和可重复的晶体缺陷调制工程(CIME)对于半导体科学技术的发展至关重要。黄煌,欧小平和同事在文章1700307中描述了一种基于新颖的电化学掺杂和强氧化热力学退火工艺的通用可行的ZnO CIME。他们的方法可能对新型宽带隙具有重大意义半导体器件。
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更新日期:2018-02-12
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