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Quantitative imaging of anisotropic material properties with vectorial ptychography
Optics Letters ( IF 3.1 ) Pub Date : 2018-02-09 , DOI: 10.1364/ol.43.000763
Patrick Ferrand , Arthur Baroni , Marc Allain , Virginie Chamard

Following the recent establishment of the formalism of vectorial ptychography [Opt. Lett. 40, 5144 (2015) [CrossRef] ], first measurements, to the best of our knowledge, are reported in the optical range, demonstrating the capability of the proposed method to map the four parameters of the Jones matrix of an anisotropic specimen, and therefore to quantify a wide range of optical material properties, including power transmittance, optical path difference, diattenuation, retardance, and fast-axis orientation.

中文翻译:

矢量刻印技术对各向异性材料性能进行定量成像

继最近建立矢量刻印术的形式主义之后[Opt。来吧 40,5144(2015)[交叉引用] ],第一次测量,就我们所知,记录在光学范围内,表明所提出的方法的各向异性样品的琼斯矩阵的四个参数映射的能力,并因此,要量化各种光学材料的特性,包括功率透射率,光程差,衰减,延迟和快轴方向。
更新日期:2018-02-14
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