One hundred nanometer thick Fe–Co–Ni material chips were prepared and isothermally annealed at 500, 600, and 700 °C, respectively. Pixel-by-pixel composition and structural mapping was performed by microbeam X-ray at synchrotron light source. Diffraction images were recorded at a rate of 1 pattern/s. The XRD patterns were automatically processed, phase-identified, and categorized by hierarchical clustering algorithm to construct the composition-phase map. The resulting maps are consistent with corresponding isothermal sections reported in the ASM Alloy Phase Diagram Database, verifying the effectiveness of the present approach in phase diagram construction.

中文翻译：

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组合材料芯片法快速构建Fe-Co-Ni组成-相图

制备了一百纳米厚的Fe–Co–Ni材料芯片，并分别在500、600和700°C下进行了等温退火。在同步加速器光源下，通过微束X射线进行逐像素组成和结构映射。以1个图案/秒的速率记录衍射图像。通过分层聚类算法对XRD图谱进行自动处理，进行相识别和分类，以构建构图-相图。所得图与ASM合金相图数据库中报告的相应等温截面一致，从而验证了本方法在相图构建中的有效性。