Guided Modes of Anisotropic van der Waals Materials Investigated by near-Field Scanning Optical Microscopy,ACS Photonics

当前位置： X-MOL 学术 › ACS Photonics › 论文详情

Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)

Guided Modes of Anisotropic van der Waals Materials Investigated by near-Field Scanning Optical Microscopy
ACS Photonics ( IF 6.5 ) Pub Date : 2018-01-27 00:00:00 , DOI: 10.1021/acsphotonics.7b01518
Daniel Wintz , Kundan Chaudhary , Ke Wang , Luis A. Jauregui , Antonio Ambrosio , Michele Tamagnone , Alexander Y. Zhu , Robert C. Devlin , Jesse D. Crossno , Kateryna Pistunova , Kenji Watanabe ₁ , Takashi Taniguchi ₁ , Philip Kim , Federico Capasso

Affiliation

Guided modes in nanometer thick anisotropic van der Waals materials are experimentally investigated and their refractive indices in visible wavelengths are extracted. Our method involves near-field scanning optical microscopy of waveguide (transverse electric) and surface plasmon polariton (transverse magnetic) modes in h-BN/SiO₂/Si and Ag/h-BN stacks, respectively. We determine the dispersion of these modes and use this relationship to extract anisotropic refractive indices of h-BN flakes. In the wavelength interval 550–700 nm, the in-plane and out-of-plane refractive indices are in the range 1.98–2.12 and 1.45–2.12, respectively. Our approach of using near-field scanning optical microscopy allows for the direct study of the interaction between light and two-dimensional van der Waals materials and heterostructures.

中文翻译：

近场扫描光学显微镜研究的范德华各向异性各向异性材料的导模

对纳米厚各向异性范德华材料中的导模进行了实验研究，并提取了它们在可见光波长下的折射率。我们的方法涉及在h-BN / SiO ₂中波导（横向电）和表面等离激元极化（横向磁）模式的近场扫描光学显微镜/ Si和Ag / h-BN堆叠。我们确定这些模式的色散，并利用这种关系来提取h-BN薄片的各向异性折射率。在550-700 nm的波长范围内，面内和面外折射率分别在1.98-2.12和1.45-2.12范围内。我们使用近场扫描光学显微镜的方法可以直接研究光与二维范德华材料和异质结构之间的相互作用。

更新日期：2018-01-27

点击分享查看原文

点击收藏

公开下载

阅读更多本刊最新论文本刊介绍/投稿指南11