Subwavelength Far Field Imaging of Nanoparticles with Parametric Indirect Microscopic Imaging,ACS Photonics

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Subwavelength Far Field Imaging of Nanoparticles with Parametric Indirect Microscopic Imaging
ACS Photonics ( IF 6.5 ) Pub Date : 2018-01-23 00:00:00 , DOI: 10.1021/acsphotonics.7b01406
Kaleem Ullah ₁ , Xuefeng Liu ₁ , Muhammad Habib ₂ , Zhe Shen ₁

Affiliation

In this work, we propose a polarization modulation technique that employs a reconstruction method to map the subwavelength scattering field distributions in the form of polarization parameters. The spatial signature of these indirect parameters delivers an extra scattering information that helps us to resolve scattering modes information on the sample under test. We apply this method to single and dimer spherical particles and we successfully resolve their spatial scattering distribution. In particular, we explore the subwavelength scattering modes information provided by the spatial signature of these polarization parameters. The experimental results have been verified by Mie theory and finite difference time domain (FDTD) method.

中文翻译：

参数间接显微镜成像技术对纳米粒子的亚波长远场成像

在这项工作中，我们提出了一种偏振调制技术，该技术采用一种重构方法以偏振参数的形式映射亚波长散射场分布。这些间接参数的空间特征提供了额外的散射信息，可帮助我们解析被测样品上的散射模式信息。我们将此方法应用于单个和二聚体球形粒子，并成功解析了它们的空间散射分布。特别是，我们探索了这些偏振参数的空间特征所提供的亚波长散射模式信息。实验结果已通过米氏理论和时域有限差分法（FDTD）进行了验证。

更新日期：2018-01-23

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