Detection and characterization of biogenic selenium nanoparticles in selenium-rich yeast by single particle ICPMS†,Journal of Analytical Atomic Spectrometry

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Detection and characterization of biogenic selenium nanoparticles in selenium-rich yeast by single particle ICPMS†
Journal of Analytical Atomic Spectrometry ( IF 3.1 ) Pub Date : 2018-01-22 00:00:00 , DOI: 10.1039/c7ja00378a
Javier Jiménez-Lamana _{1,

2,

3} , Isabel Abad-Álvaro _{4,

5,

6,

7,

8} , Katarzyna Bierla _{1,

2,

3} , Francisco Laborda _{4,

5,

6,

7,

8} , Joanna Szpunar _{1,

2,

3} , Ryszard Lobinski _{1,

2,

3}

Affiliation

A method based on single particle inductively coupled plasma mass spectrometry (SP-ICPMS) was developed for the analysis of commercial Se-rich yeasts, to confirm the occurrence of selenium nanoparticles in these food supplements. A considerable reduction of background levels was achieved by combining data acquisition at microsecond dwell times and the use of a H₂ reaction cell, improving by a factor of 10 the current state-of-the-art methodology, and bringing size detection limits down to 18 nm for selenium nanoparticles. The presence of nanoparticulate selenium was revealed by size-exclusion chromatography ICPMS, with detection of a selenium peak at the exclusion volume of the column showing absorption at a wavelength corresponding to selenium nanoparticles. SP-ICPMS allowed us to confirm the presence of Se-nanoparticles, as well as to calculate the nanoparticle size distribution, from information about the shape and elemental composition of the nanoparticles obtained by transmission electron microscopy (TEM) and energy dispersive X-ray spectroscopy (EDS), respectively. These results reveal the significance of nanoparticles in the speciation of metals and metalloids in biological samples and the capability of SP-ICPMS in combination with TEM-EDS to carry out these analyses.

中文翻译：

通过单颗粒ICPMS检测和表征富硒酵母中生物型硒纳米颗粒†

开发了一种基于单颗粒电感耦合等离子体质谱法（SP-ICPMS）的方法，用于分析商业性富硒酵母，以确认这些食品补充剂中硒纳米颗粒的存在。通过结合微秒驻留时间的数据采集和使用H _2可以大大降低背景水平反应池，将当前最先进的方法提高了10倍，并使硒纳米颗粒的尺寸检测极限降低到18 nm。通过尺寸排阻色谱ICPMS揭示了纳米颗粒硒的存在，在柱的排除体积处检测到硒峰，显示出在对应于硒纳米颗粒的波长处的吸收。SP-ICPMS使我们能够通过透射电子显微镜（TEM）和能量色散X射线光谱学获得有关纳米颗粒的形状和元素组成的信息，从而确认硒纳米颗粒的存在以及计算纳米颗粒的尺寸分布。（EDS）。

更新日期：2018-01-22

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