Total electronic conductivity (σ_e^total) of LiNi_0.45Mn_1.485Cr_0.05O₄ thin film (LNM–Cr: 40 nm in thickness) between 3.5 and 4.9 V (vs. Li metal anode) was measured using all-solid-state thin-film battery (Li/LiPON/LPO/LNM–Cr) fabricated on interdigitated array (IDA) electrode. The LNM–Cr with disordered spinel phase was prepared by pulsed laser deposition on the IDA electrode. The σ_e^total depended on the voltage and reversibly changed regardless of lithium extraction/insertion process. Variation trends of the σ_e^total were in good agreement with the previous reports using the chemically delithiated powder materials. Grain boundary resistance contributes to the σ_e^total depending on the voltage probably because of the formation of double Schottky barrier at the grain boundaries.

总电子传导率（σ _Ë^总）的LiNi的_0.45的Mn _1.485的Cr _0.05 Ò ₄薄膜（LNM铬：在厚度为40nm）3.5和4.9（相对于Li金属阳极）之间，使用全固态薄测量膜电池（Li / LiPON / LPO / LNM-Cr）制造在叉指阵列（IDA）电极上。通过在IDA电极上进行脉冲激光沉积，制备出具有无序尖晶石相的LNM-Cr。所述σ _ë^总依赖于电压和无论锂提取/插入处理的可逆改变。在σ的变化趋势_Ë^总与以前使用化学脱锂粉末材料的报告非常吻合。晶界电阻有助于σ _È^总取决于电压可能是因为在晶界处形成双肖特基势垒的。