当前位置：
X-MOL 学术
›
Small Methods
›
论文详情
Our official English website, www.x-mol.net, welcomes your
feedback! (Note: you will need to create a separate account there.)
Nondestructive Method for the Determination of the Electric Polarization Orientation in Thin Films: Illustration on Gallium Ferrite Thin Films
Small Methods ( IF 10.7 ) Pub Date : 2017-11-13 , DOI: 10.1002/smtd.201700234 Chistophe Lefevre 1 , Anna Demchenko 1 , Corinne Bouillet 1 , Martina Luysberg 2 , Xavier Devaux 3 , François Roulland 1 , Gilles Versini 1 , Sophie Barre 1 , Yusuke Wakabayashi 4 , Nathalie Boudet 5 , Cédric Leuvrey 1 , Manuel Acosta 1 , Christian Meny 1 , Elodie Martin 1 , Stéphane Grenier 5 , Vincent Favre-Nicolin 6 , Nathalie Viart 1
Small Methods ( IF 10.7 ) Pub Date : 2017-11-13 , DOI: 10.1002/smtd.201700234 Chistophe Lefevre 1 , Anna Demchenko 1 , Corinne Bouillet 1 , Martina Luysberg 2 , Xavier Devaux 3 , François Roulland 1 , Gilles Versini 1 , Sophie Barre 1 , Yusuke Wakabayashi 4 , Nathalie Boudet 5 , Cédric Leuvrey 1 , Manuel Acosta 1 , Christian Meny 1 , Elodie Martin 1 , Stéphane Grenier 5 , Vincent Favre-Nicolin 6 , Nathalie Viart 1
Affiliation
|
The knowledge and control of the electric polarization in multiferroic thin films is currently the subject of extensive research efforts. This is the key toward a possible transformation into devices of the exciting phenomena such as conductance modification or polarity observed at ferroelectric domain walls. The main methods currently available to determine the polarization characteristics in thin films suffer from being local, time demanding, potentially vitiated by artefacts, or even blinded in some cases. A nondestructive method based on resonant diffraction is proposed for the determination of the polarization orientation in multiferroic, ferroelectric, or pyroelectric thin films. The method is experimentally illustrated for multiferroic gallium ferrite thin films. Its validity is also theoretically shown for the perovskite‐based structure of the emblematic ferroelectric Pb(Zr,Ti)O3, which augurs numerous prospects for its potential applications.
中文翻译：
确定薄膜电极化方向的无损方法：镓铁氧体薄膜上的插图
多铁性薄膜中的极化的知识和控制目前是广泛研究的主题。这是可能将诸如铁电畴壁处观察到的电导率改变或极性之类的令人兴奋的现象转换成器件的关键。当前可用于确定薄膜偏振特性的主要方法是局部的，需要时间的，可能因伪影而消失，甚至在某些情况下是盲目的。提出了一种基于共振衍射的非破坏性方法，用于确定多铁性，铁电性或热电性薄膜的极化取向。实验证明了该方法用于多铁性镓铁氧体薄膜。3，其潜在的应用前景广阔。
更新日期：2017-11-13
中文翻译：
确定薄膜电极化方向的无损方法：镓铁氧体薄膜上的插图
多铁性薄膜中的极化的知识和控制目前是广泛研究的主题。这是可能将诸如铁电畴壁处观察到的电导率改变或极性之类的令人兴奋的现象转换成器件的关键。当前可用于确定薄膜偏振特性的主要方法是局部的，需要时间的，可能因伪影而消失，甚至在某些情况下是盲目的。提出了一种基于共振衍射的非破坏性方法，用于确定多铁性，铁电性或热电性薄膜的极化取向。实验证明了该方法用于多铁性镓铁氧体薄膜。3，其潜在的应用前景广阔。
京公网安备 11010802027423号