当前位置: X-MOL 学术Curr. Opin. Solid State Mater. Sci. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Analytical transmission electron microscopy at organic interfaces
Current Opinion in Solid State & Materials Science ( IF 12.2 ) Pub Date : 2016-04-11 , DOI: 10.1016/j.cossms.2016.02.005
Angela E. Goode , Alexandra E. Porter , Michał M. Kłosowski , Mary P. Ryan , Sandrine Heutz , David W. McComb

Organic materials are ubiquitous in all aspects of our daily lives. Increasingly there is a need to understand interactions between different organic phases, or between organic and inorganic materials (hybrid interfaces), in order to gain fundamental knowledge about the origin of their structural and functional properties. In order to understand the complex structure–property–processing relationships in (and between) these materials, we need tools that combine high chemical sensitivity with high spatial resolution to allow detailed interfacial characterisation. Analytical transmission electron microscopy (TEM) is a powerful and versatile technique that can fulfil both criteria. However, the application of analytical TEM to organic systems presents some unique challenges, such as low contrast between phases, and electron beam sensitivity. In this review recent analytical TEM approaches to the nanoscale characterisation of two systems will be discussed: the hybrid collagen/mineral interface in bone, and the all-organic donor/acceptor interface in OPV devices.



中文翻译:

有机界面的分析型透射电子显微镜

有机材料在我们日常生活的各个方面无处不在。越来越需要了解不同有机相之间或有机和无机材料(混合界面)之间的相互作用,以便获得有关其结构和功能特性起源的基本知识。为了了解这些材料中(以及之间)的复杂的结构,属性与处理之间的关系,我们需要结合了高化学敏感性和高空间分辨率的工具,以进行详细的界面表征。分析型透射电子显微镜(TEM)是一项功能强大且用途广泛的技术,可以同时满足这两个条件。但是,将分析型TEM应用于有机系统提出了一些独特的挑战,例如相之间的对比度低以及电子束灵敏度。

更新日期:2016-04-11
down
wechat
bug