Abstract XRD spectra from the contact and free surfaces of amorphous Ti50Ni25Cu25 ribbon prepared by melt-spinning technique, crystallized, and aged at 500 °C for different times were collected for intensive investigation. A thin layer of textured grains with a thickness of 1 μm formed at the contact surface, having {100}B2 planes parallel to the ribbon surface during the crystallization process and resulting in an extraordinarily strong (200)B2 diffraction peak from the contact surface. This textured layer was caused by the pre-arrangement of atoms with their easy-growth BCC direction parallel to the maximum temperature gradient perpendicular to the contact surface during the melt-spinning process. On the other hand, equiaxed and randomly orientated grains of about 300 ± 100 nm in size formed at the free surface. During the aging process, when aging time exceeded 15 min, precipitation of TiCu along {100}B2 planes significantly distorted the B2 lattice and thus led to broadening, which decreased the intensity of (200)B2 diffraction. Comparisons of experimental results with reported studies show that the texture developed in Ti50Ni25Cu25 ribbon is highly affected by the thickness and cooling rate.

中文翻译：

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X射线衍射法研究非晶Ti 50 Ni 25 Cu 25 形状记忆带的结晶行为

摘要 收集了通过熔纺技术制备、结晶并在 500 °C 下时效不同时间的非晶 Ti50Ni25Cu25 薄带的接触面和自由面的 XRD 谱，以进行深入研究。在接触表面形成了一层厚度为 1 μm 的织构晶粒薄层，在结晶过程中具有平行于带表面的 {100}B2 平面，并导致来自接触表面的异常强的 (200)B2 衍射峰。该纹理层是由原子的预排列引起的，它们的易生长 BCC 方向平行于熔纺过程中垂直于接触表面的最大温度梯度。另一方面，在自由表面形成大小约为 300 ± 100 nm 的等轴和随机取向的晶粒。在老化过程中，当时效时间超过 15 分钟时，TiCu 沿 {100}B2 面的析出显着扭曲了 B2 晶格，从而导致展宽，从而降低了 (200)B2 衍射强度。实验结果与报告研究的比较表明，Ti50Ni25Cu25 薄带中形成的织构受厚度和冷却速度的影响很大。