Single-particle tracking is a powerful technique to reveal an underlying principle of microscopic phenomena. Here we report an optical microscopy technique, polarization-selective interferometric scattering microscopy, that enables us to capture rotational as well as positional information on nanoscale objects. This technique grants all the merits of interferometric scattering microscopy and provides a further advantage of the capability of determining the orientation of single nanoscopic objects in a straightforward and facile way. We anticipate that this technique would be of critical use in rotational tracking of a single anisotropic particle or biological system in the nanoscopic world.

中文翻译：

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具有偏振选择性双重检测方案的干涉散射显微镜：捕获各向异性纳米物体的方向信息

单粒子跟踪是一种强大的技术，可以揭示微观现象的基本原理。在这里，我们报告了一种光学显微镜技术，即偏振选择性干涉散射显微镜，它使我们能够捕获纳米尺度物体上的旋转以及位置信息。该技术赋予了干涉散射显微镜的所有优点，并提供了以简单明了的方式确定单个纳米物体取向的能力的进一步优势。我们预计该技术在纳米世界中单个各向异性粒子或生物系统的旋转跟踪中将至关重要。