We have studied the magnetic and electrical transport properties of epitaxial NiAs-type CrTe thin films grown on SrTiO₃(111) substrates. Unlike rectangle hysteresis loops obtained from magnetic measurements, we have identified intriguing extra bump/dip features from anomalous Hall experiments on the films with thicknesses less than 12 nm. This observed Hall anomaly is phenomenologically consistent with the occurrence of a topological Hall effect(THE) in chiral magnets with a skyrmion phase. Furthermore, the THE contribution can be tuned by the film thickness, showing the key contribution of asymmetric interfaces in stabilizing Néel-type skyrmions. Our work demonstrates that a CrTe thin film on SrTiO₃(111) substrates is a good material candidate for studying real-space topological transport.

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我们已经研究了在SrTiO ₃（111）衬底上生长的外延NiAs型CrTe薄膜的磁和电传输性质。与通过磁测量获得的矩形磁滞回线不同，我们已经通过异常霍尔实验在厚度小于12 nm的薄膜上发现了有趣的额外凹凸特性。在现象学上，这种观察到的霍尔异常与具有天生离子相的手性磁体中的拓扑霍尔效应（THE）的发生在现象学上是一致的。此外，可以通过薄膜厚度来调节THE贡献，显示出不对称界面在稳定Néel型天体离子中的关键作用。我们的工作表明，在SrTiO ₃上有CrTe薄膜（111）衬底是研究真实空间拓扑传输的良好材料候选。

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