Microstructure variations induced by excess PbX2 or AX within perovskite thin films,Chemical Communications

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Microstructure variations induced by excess PbX2 or AX within perovskite thin films
Chemical Communications ( IF 4.3 ) Pub Date : 2017-11-06 00:00:00 , DOI: 10.1039/c7cc07534k
Guanhaojie Zheng _{1,

2,

3,

4,

5} , Cheng Zhu _{6,

7,

8,

9} , Yihua Chen _{4,

6,

10,

11,

12} , Juchen Zhang _{4,

6,

10,

11,

12} , Qi Chen _{6,

7,

8,

9} , Xingyu Gao _{1,

2,

3,

4,

5} , Huanping Zhou _{4,

6,

10,

11,

12}

Affiliation

We systematically investigated the impact of stoichiometric ratio variation between PbX₂ and AX on hybrid perovskite films from the perspective of microstructure, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering (GIWAXS) technique. The tuned crystal plane stacking in perovskite films can consequently enlighten further explorations about the relationship between microstructure and solar cell performance.

中文翻译：

钙钛矿薄膜中过量的PbX ₂或AX引起的微观结构变化

我们使用二维同步辐射辐射掠射入射广角X射线散射（GIWAXS），从微观结构，特别是在平面堆叠方向上，系统地研究了PbX ₂和AX之间化学计量比变化对杂化钙钛矿薄膜的影响。技术。因此，钙钛矿薄膜中调谐的晶面堆叠可以启发人们进一步探索微观结构与太阳能电池性能之间的关系。

更新日期：2017-11-21

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