Photoinduced degradation from trace 1,8-diiodooctane in organic photovoltaics,Journal of Materials Chemistry C

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Photoinduced degradation from trace 1,8-diiodooctane in organic photovoltaics
Journal of Materials Chemistry C ( IF 5.7 ) Pub Date : 2017-11-03 00:00:00 , DOI: 10.1039/c7tc04358a
Ian E. Jacobs _{1,

2,

3,

4} , Faustine Wang _{2,

3,

4,

5} , Zaira I. Bedolla Valdez _{2,

3,

4,

5} , Alejandra N. Ayala Oviedo _{2,

3,

4,

5} , David J. Bilsky _{1,

2,

3,

4} , Adam J. Moulé _{2,

3,

4,

5}

Affiliation

1,8-Diiodooctane (DIO) is a high boiling point solvent additive commonly used to control the active layer morphology of bulk-heterojunction organic photovoltaic (OPV) films. OPV devices fabricated using DIO often show improved efficiency, but recent studies have suggested that light exposure may cause residual DIO to react with OPV materials. We use NMR to quantify the amount of residual DIO in bulk heterojunction (BHJ) layers, finding that after a typical thermal evaporator high vacuum cycle DIO is still easily observed. This suggests that most completed devices contain trapped DIO. While OPV devices processed without DIO remain stable, devices processed with DIO rapidly degrade under illumination, even if they had undergone sequential heating and vacuum steps to remove the DIO impurity. These results suggest that impurities that can act as radical initiators, such as DIO, can be detrimental even at concentrations as low as 20 ppm by mass.

中文翻译：

有机光伏中痕量1,8-二碘辛烷的光诱导降解

1,8-二碘辛烷（DIO）是一种高沸点溶剂添加剂，通常用于控制本体异质结有机光伏（OPV）薄膜的活性层形态。使用DIO制造的OPV器件通常显示出更高的效率，但是最近的研究表明，曝光可能导致残留的DIO与OPV材料发生反应。我们使用NMR来量化本体异质结（BHJ）层中残留DIO的数量，发现在典型的热蒸发器之后，仍很容易观察到高真空循环DIO。这表明大多数完成的设备都包含被困的DIO。尽管未经过DIO处理的OPV器件保持稳定，但是经过DIO处理的器件即使经过顺序的加热和真空步骤以去除DIO杂质，其在光照下也会迅速降解。

更新日期：2017-11-17

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