Origin of atomic-deficient free-volume structure in ZnO–ZrO₂–B₂O₃ glass ceramic versus ZrO₂ concentration was explored by positron annihilation lifetime spectroscopy (PAL) technique. XRD and SEM studies, on the titled samples indicated that the samples consist of tetragonal ZnZrO₃ perovskite crystal phases. The IR studies suggested that Zr⁴⁺ ions prevailingly occupy octahedral positrons and play crucial role in formation of positron trapping holes in the samples. The PAL studies using 0.1 MBq ²²Na positron source indicated a significant variation in the positron annihilation life time with increasing ZrO₂ for both positron- and positronium (Ps) trapping channels. The intensity of the longest positron annihilation component I₃ is decreased from 4.45 to 3.07%, whereas o-Ps decay lifetime τ₃ is enhanced from 1.18 to 1.34 ns with increase of ZrO₂ from 0 to 5.0 mol%. These results suggested that the glass ceramic CZ₅ contains the maximum free space or void expansion and void agglomeration.

用正电子an没寿命谱（PAL）技术研究了ZnO–ZrO ₂ –B ₂ O ₃玻璃陶瓷中原子缺陷自由体积结构与ZrO ₂浓度的关系。对标题样品的XRD和SEM研究表明，样品由四方ZnZrO ₃钙钛矿晶体相组成。红外研究表明，Zr ⁴⁺离子主要占据八面体正电子，并在样品中正电子俘获孔的形成中起关键作用。使用0.1 MBq ²² Na正电子源的PAL研究表明，随着ZrO _2的增加，正电子an没寿命的显着变化用于正电子和正电子（Ps）捕获通道。最长的正电子湮没分量的强度我₃是从4.45降低到3.07％，而直径：-PS衰寿命τ ₃是从1.18至1.34纳秒与的ZrO增加而增强₂为0〜5.0摩尔％。这些结果表明，玻璃陶瓷CZ ₅包含最大的自由空间或空隙膨胀和空隙附聚。